High Resolution True Differential™ Horizontal Push Rod Dilatometer DIL 832 from TA Instruments

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High Resolution True Differential™ Horizontal Push Rod Dilatometer DIL 832

Description

DIL 832 features an impressive array of unique technologies and capabilities that make of it the ideal tool in any R&D laboratory for the characterization of mechanical and dimensional properties: TA Instruments exclusive True Differential™ technology, the patented 1 nm resolution optical encoder, a family of new dynamic furnaces, and the new linear sample load motor. The result is the best performing horizontal push-rod dilatometer available on the market, regardless of the application or the material to be tested.

The sample load is ensured by a linear motor with a range of 0.01 to 1.00 N, a force resolution of 0.01 N and a linearity better than 0.01 N across the total measuring range of 5000 µm.

The patented optical incremental encoder brings length measurement’s true resolution down to a best in class 1 nm. This allows for the measurement of shorter samples yet preserving an outstanding ΔL resolution.

The newly designed measuring head housing and the active electrical thermal stabilization ensure unprecedented stability of the detection core. Combined with TA Instruments exclusive True Differential™ technology and the unique design of TA Instruments furnaces, results in the DIL 832 delivering an industry leading CTE accuracy of 0.01 x 10-6 K-1.

The DIL 832 automatically records the initial sample length and is capable of up to a maximum sample length of 25 mm and a maximum diameter of 6 mm .

The water cooled furnaces provide a very dynamic temperature programming capability with a maximum heating rate of 50 K/min, but most of all a cool down time as short as 13 minutes from 1000°C to room temperature, up to 15 times shorter than competitive instruments.

The integrated electronics provide network connection, and the integrated touch screen allows you to perform many functions directly on the instrument and shows, in real time, measurement parameters and test’s time-to-completion.